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Case Temperature Waveform Similarity-based Online Aging Monitoring for SiC MOSFETs of Accelerated Power Cycling Tests for DC-SSPCs
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-12-09 , DOI: 10.1109/jestpe.2024.3513357 Bin Yu, Xingjian Shi, Ze Zhou, Enyao Xiang, Hongyi Gao, Haoze Luo, Wuhua Li
中文翻译：
基于外壳温度波形相似性的 SiC MOSFET 在线老化监测DC-SSPCs 加速功率循环测试
更新日期：2024-12-09
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-12-09 , DOI: 10.1109/jestpe.2024.3513357 Bin Yu, Xingjian Shi, Ze Zhou, Enyao Xiang, Hongyi Gao, Haoze Luo, Wuhua Li
中文翻译：
基于外壳温度波形相似性的 SiC MOSFET 在线老化监测DC-SSPCs 加速功率循环测试
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