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ALD and CVD deposition of pure thin gold films from a stable dimethylgold(III) precursor
Nanoscale ( IF 5.8 ) Pub Date : 2024-12-05 , DOI: 10.1039/d4nr04765f
Roman G. Parkhomenko, Igor K. Igumenov, Sebastien Elie Hadjadj, Sergey V. Trubin, Mato Knez

The synthesis and thermal properties of a volatile dimethylgold(III) complex Me2AuSSP(OiPr)2 are reported. Unlike most other volatile Au(I) and Au(III) compounds, the complex is stable upon storage, does not require any special handling conditions, and exhibits both good volatility and thermal stability. The compound was tested as a CVD and ALD precursor, yielding good quality films in both processes. The influence of hydrogen and vacuum ultraviolet on the morphology and composition of the gold films in CVD processes was investigated. The growth rate in ALD experiments was from 0.47 to 1.13 Å per cycle at deposition temperatures of 130–170 °C. Both CVD and ALD grown films exhibited a polycrystalline structure, a high conductivity (3.1–55.7 μΩ cm) and a low amount of impurities (<6 at%).

中文翻译:


来自稳定二甲基金 (III) 前驱体的纯金薄膜的 ALD 和 CVD 沉积



报道了挥发性二甲基金 (III) 配合物 Me2AuSSP(OPr)2 的合成和热性质。与大多数其他挥发性 Au() 和 Au(III) 化合物不同,该复合物在储存时很稳定,不需要任何特殊的处理条件,并且表现出良好的挥发性和热稳定性。该化合物作为 CVD 和 ALD 前驱体进行了测试,在这两个过程中都产生了高质量的薄膜。研究了氢和真空紫外对 CVD 工艺中金膜形貌和组成的影响。在 130–170 °C 的沉积温度下,ALD 实验中的生长速率为每循环 0.47 至 1.13 Å。 CVD 和 ALD 生长的薄膜均表现出多晶结构、高电导率 (3.1–55.7 μΩ cm) 和低杂质量 (<6 at%)。
更新日期:2024-12-05
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