Photostimulated luminescence in the ultraviolet (PSL‐UV) holds promise for high‐security anti‐counterfeiting applications, especially in brightly lit environments. Despite its potential, research on PSL‐UV is relatively limited. Here, the PSL‐UV properties of a NaYF4:Gd3+ fluoride‐based phosphor is explored, demonstrating its suitability for advanced anti‐counterfeiting purposes. This phosphor effectively captures excitation energy from X‐rays and subsequently emits UV light at 311 nm when stimulated by visible ambient light. Remarkably, the material exhibits exceptional reliability and durability, maintaining effectual PSL‐UV output even after enduring exposure to 100 cycles of ambient light and subsequent decay. Furthermore, ultraviolet imaging experiments highlight the practicality of PSL‐UV for real‐world implementation, presenting a fresh and robust strategy for enhancing security and authentication processes.

中文翻译：

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光刺激紫外发光在日光条件下防伪


紫外线中的光刺激发光 （PSL-UV） 有望实现高安全性的防伪应用，尤其是在明亮的环境中。尽管 PSL-UV 具有潜力，但对 PSL-UV 的研究相对有限。本文探讨了 NaYF4：Gd3+ 氟化物基荧光粉的 PSL-UV 特性，证明了其适用于高级防伪目的。这种荧光粉有效地捕获 X 射线的激发能量，随后在可见光刺激下发射 311 nm 的紫外线。值得注意的是，该材料表现出卓越的可靠性和耐用性，即使在承受 100 次环境光循环和随后的衰减后也能保持有效的 PSL-UV 输出。此外，紫外成像实验突出了 PSL-UV 在实际应用中的实用性，为增强安全性和身份验证过程提供了一种新颖而强大的策略。