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Fluka and microshield simulation assessment of nuclear radiation attenuation by binary nanocomposites
Radiation Physics and Chemistry ( IF 2.8 ) Pub Date : 2024-11-21 , DOI: 10.1016/j.radphyschem.2024.112409
Atef El-Taher, Hesham MH. Zakaly, Elhassan A. Allam, Rehab M. El- Sharkawy, Meshari Al Meshari, Abdallah M. Soliman, Mohammed Salih, Haitham Alahmad, Mohamed E. Mahmoud

In this work, a theoretical simulation study using the FLUKA software was implemented to estimate the diverse values of radiation shielding parameters such as mass attenuation coefficient, μm, mean free path, MFP, atomic cross-section, σa, effective removal cross-sections for fast neutrons, ΣR, effective electron density, Neff, and effective atomic number, Zeff, for various composition concentrations of nano bentonite doped with N–HgO. The prepared nanocomposite materials were characterized by using XRD, and SEM to establish the morphological and structural properties. It was found that both the value of density and, μm, increase by increasing the concentration of N–HgO. The study focused on the prepared composite's computerized shielding behavior in the region of 81 to 2.614 × 103 keV. The mass attenuation coefficient was determined at different photon energies for example at 1173 keV for 0% N–HgO μm was 0.054 but cm2/g it was found to be 0.058 cm2/g for 40% N–HgO, and at 1332 keV was 0.055 cm2/g for 0% N–HgO, and 0.050 cm2/g for 40% N–HgO. On the other hand the attenuation toward neutrons was established and the effective removal cross-sections for fast neutrons ΣR values increased as the following; 0-Hg (0 wt %) (0.0932 cm−1) < 1-Hg (10 wt %) (0.0948 cm−1) < 2-Hg (20 wt %) (0.0983 cm−1) < 3-Hg (30 wt %) (0.0988 cm−1) < 4-Hg (40 wt %)(0.1019 cm−1). The fact that the 4-Hg (40 wt %) N–HgO within nano bentonite samples has the highest ΣR may be due to the large elemental composition of high-Z. It was concluded that the proposed composite may be used in nuclear safety applications as radiation exposure protection.

中文翻译:


二元纳米复合材料核辐射衰减的 Fluka 和 microshield 模拟评估



在这项工作中,使用 FLUKA 软件进行了理论模拟研究,以估计各种掺杂 N-HgO 的纳米膨润土成分浓度的辐射屏蔽参数,如质量衰减系数 μm、平均自由程、MFP、原子截面 σa、快中子的有效去除截面 ΣR、有效电子密度 Neff 和有效原子序数 Zeff。使用 XRD 和 SEM 对制备的纳米复合材料进行了表征,以确定其形貌和结构性能。研究发现,密度和 μm 的值都随着 N-HgO 浓度的增加而增加。该研究的重点是所制备复合材料在 81 至 2.614 × 103 keV 范围内的计算机屏蔽行为。在不同光子能量下测定质量衰减系数,例如,在 1173 keV 下,0% N-HgO μm 为 0.054,但 cm2/g,40% N-HgO 为 0.058 cm2/g,在 1332 keV 时,0% N-HgO 为 0.055 cm2/g,40% N-HgO 为 0.050 cm2/g。另一方面,建立了对中子的衰减,并且快中子的有效去除截面 ΣR 值增加如下;0-Hg (0 wt %) (0.0932 cm-1) < 1-Hg (10 wt %) (0.0948 cm-1) < 2-Hg (20 wt %) (0.0983 cm-1) < 3-Hg (30 wt %) (0.0988 cm-1) < 4-Hg (40 wt %) (0.1019 cm-1)。纳米膨润土样品中 4-Hg (40 wt %) N-HgO 具有最高的 ΣR 可能是由于高 Z 元素组成大。结论是,所提出的复合材料可用于核安全应用,作为辐射暴露防护。
更新日期:2024-11-21
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