Microscopy has long expanded humanity’s understanding of the microscopic world, transcending limitations of the naked eye. The atomic force microscope (AFM), in particular, marks a major advancement in this field, enabling nanoscale investigations of materials through direct physical probing of their surface. Unlike traditional microscopes that use light or electrons, AFM’s unique methodology allows for both imaging on the atomic scale and precise manipulation of a material’s mechanical, electrical, and chemical properties. A key advantage also lies in its capacity for multimodal analysis, where multiple properties can be simultaneously measured to provide comprehensive insights into material behavior.

中文翻译：

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在 AFM 中桥接机械和电气分析：进展、技术和应用


长期以来，显微镜技术扩展了人类对微观世界的理解，超越了肉眼的限制。尤其是原子力显微镜 （AFM），它标志着该领域的重大进步，它可以通过对材料的表面进行直接物理探测来对材料进行纳米级研究。与使用光或电子的传统显微镜不同，AFM 的独特方法既可以在原子尺度上成像，也可以精确操纵材料的机械、电学和化学特性。一个关键优势还在于它能够进行多模态分析，可以同时测量多种特性，从而全面了解材料行为。