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Bond Wire Failure Monitoring of SiC MOSFETs Based on the Body Diode Voltage
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-11-13 , DOI: 10.1109/jestpe.2024.3497938 Xiaolei Wang, Pengju Sun, Yinghui Yang
中文翻译:
基于体二极管电压的 SiC MOSFET 键合线故障监测
更新日期:2024-11-13
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-11-13 , DOI: 10.1109/jestpe.2024.3497938 Xiaolei Wang, Pengju Sun, Yinghui Yang
中文翻译:
基于体二极管电压的 SiC MOSFET 键合线故障监测