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Procedure for reducing cross-resonance gate errors using pulse-level control
Quantum Science and Technology ( IF 5.6 ) Pub Date : 2024-11-13 , DOI: 10.1088/2058-9565/ad895b
David Danin and Felix Tennie

Current implementations of superconducting qubits are often limited by the low fidelities of multi-qubit gates. We present a reproducible and runtime-efficient pulse-level approach for calibrating an improved cross-resonance gate CR(θ) for arbitrary θ. This CR(θ) gate can be used to produce a wide range of other two-qubit gates via the application of standard single-qubit gates. By performing an interleaved randomised benchmarking sequence, we demonstrate that our approach leads to significantly lower incoherent errors than the circuit-level approach currently used by IBM. Hence, our procedure provides a genuine improvement for applications where noise remains a limiting factor.

中文翻译:


使用脉冲电平控制减少交叉谐振门误差的程序



超导量子比特的当前实现通常受到多量子比特门的低保真度的限制。我们提出了一种可重现且运行时高效的脉冲级方法,用于校准任意 θ 的改进交叉谐振门 CR(θ)。该 CR(θ) 门可用于通过应用标准单量子比特门来生成各种其他双量子比特门。通过执行交错随机基准测试序列,我们证明,与 IBM 目前使用的电路级方法相比,我们的方法导致不相干误差显着降低。因此,我们的程序为噪声仍然是限制因素的应用提供了真正的改进。
更新日期:2024-11-13
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