The migration of mobile ions through the metal halide perovskite layer is still one of the main reasons for the poor stability of perovskite solar cells, LEDs, and photodetectors. To characterize mobile ions in the perovskite layer, time- and frequency-based electrical measurements are promising techniques. However, the presence of transport layers complicates their interpretation, limiting the information about mobile ions that can be extracted, and it is not clear how different features in frequency- and time-domain measurements relate to mobile ions. Here, we characterize a transport-layer-free device with capacitance frequency, capacitance transient, and current transient measurements in the dark, under illumination, and at different temperatures. We extract characteristic ionic signatures from the measurements, which we reproduce with drift-diffusion simulations for each technique. This allows us to explain the origins of the different ionic signatures, advancing our understanding of how electronic characterization techniques can be used to study the properties of mobile ions.

中文翻译：

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钙钛矿半导体中离子迁移的时域和频域迹线的一致解释


移动离子通过金属卤化物钙钛矿层的迁移仍然是钙钛矿太阳能电池、LED 和光电探测器稳定性差的主要原因之一。为了表征钙钛矿层中的移动离子，基于时间和频率的电学测量是一种很有前途的技术。然而，传输层的存在使它们的解释变得复杂，限制了可以提取的移动离子的信息，并且目前尚不清楚频域和时域测量中的不同特征与移动离子的关系。在这里，我们描述了在黑暗、照明和不同温度下进行电容频率、电容瞬态和电流瞬态测量的无传输层器件。我们从测量中提取特征离子特征，并通过每种技术的漂移-扩散模拟来重现这些特征。这使我们能够解释不同离子特征的起源，从而促进我们对如何使用电子表征技术来研究移动离子特性的理解。