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Statistical Analysis of Power Semiconductor Devices Lifetime Test and Lifetime Prediction
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-11-11 , DOI: 10.1109/jestpe.2024.3495993 Xia Zhou, Zhicheng Xin, Zan Wu, Kuang Sheng
中文翻译：
功率半导体器件寿命测试与寿命预测的统计分析
更新日期：2024-11-11
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-11-11 , DOI: 10.1109/jestpe.2024.3495993 Xia Zhou, Zhicheng Xin, Zan Wu, Kuang Sheng
中文翻译：
功率半导体器件寿命测试与寿命预测的统计分析
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