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Benchmarking a trapped-ion quantum computer with 30 qubits
Quantum ( IF 5.1 ) Pub Date : 2024-11-07 , DOI: 10.22331/q-2024-11-07-1516
Jwo-Sy Chen, Erik Nielsen, Matthew Ebert, Volkan Inlek, Kenneth Wright, Vandiver Chaplin, Andrii Maksymov, Eduardo Páez, Amrit Poudel, Peter Maunz, John Gamble

Quantum computers are rapidly becoming more capable, with dramatic increases in both qubit count [1] and quality [2]. Among different hardware approaches, trapped-ion quantum processors are a leading technology for quantum computing, with established high-fidelity operations and architectures with promising scaling. Here, we demonstrate and thoroughly benchmark the IonQ Forte system: configured as a single-chain 30-qubit trapped-ion quantum computer with all-to-all operations. We assess the performance of our quantum computer operation at the component level via direct randomized benchmarking (DRB) across all 30 choose 2 = 435 gate pairs. We then show the results of application-oriented [3][4] benchmarks and show that the system passes the suite of algorithmic qubit (AQ) benchmarks up to #AQ 29. Finally, we use our component-level benchmarking to build a system-level model to predict the application benchmarking data through direct simulation. While we find that the system-level model correlates with the experiment in predicting application circuit performance, we note quantitative discrepancies indicating significant out-of-model errors, leading to higher predicted performance than what is observed. This highlights that as quantum computers move toward larger and higher-quality devices, characterization becomes more challenging, suggesting future work required to push performance further.

中文翻译:


对具有 30 个量子比特的囚禁离子量子计算机进行基准测试



量子计算机的功能正在迅速增强,量子比特数量 [1] 和质量 [2] 都得到了显著提高。在不同的硬件方法中,囚禁离子量子处理器是量子计算的领先技术,具有成熟的高保真运算和架构,具有广阔的可扩展性。在这里,我们演示了 IonQ Forte 系统并对其进行了全面的基准测试:配置为具有多对多操作的单链 30 量子比特阱离子量子计算机。我们通过直接随机基准测试 (DRB) 在所有 30 个 2 = 435 个门对中评估量子计算机操作在组件级别的性能。然后,我们展示了面向应用程序的 [3][4] 基准测试的结果,并表明该系统通过了算法量子比特 (AQ) 基准测试套件,最高可达 #AQ 29。最后,我们使用组件级基准测试来构建系统级模型,通过直接仿真来预测应用程序基准测试数据。虽然我们发现系统级模型与预测应用电路性能的实验相关,但我们注意到定量差异表明存在显著的模型外误差,导致预测性能高于观察到的性能。这突出表明,随着量子计算机朝着更大、更高质量的设备发展,表征变得更具挑战性,这表明未来需要进一步提高性能。
更新日期:2024-11-07
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