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Risk Assessment of Deep Brain Stimulator Implant Against Incident Lightning Electromagnetic Radiation
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-11-01 , DOI: 10.1109/temc.2024.3482170 Anjitha V, Sunitha K
中文翻译：
深部脑刺激器植入物对入射雷电电磁辐射的风险评估
更新日期：2024-11-01
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-11-01 , DOI: 10.1109/temc.2024.3482170 Anjitha V, Sunitha K
中文翻译：
深部脑刺激器植入物对入射雷电电磁辐射的风险评估
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