The on-chip measurement of polarization states plays an increasingly crucial role in modern sensing and imaging applications. While high-performance monolithic linearly polarized photodetectors have been extensively studied, integrated circularly polarized light (CPL) photodetectors are still hindered by inadequate discrimination capability. This study presents a broadband CPL photodetector utilizing achiral all-dielectric nanostructures, achieving an impressive discrimination ratio of ~107 at a wavelength of 405 nm. Our device shows outstanding CPL discrimination capability across the visible band without requiring intensity calibration. It functions based on the CPL-dependent near-field modes within achiral structures: under left or right CPL illumination, distinct near-field modes are excited, resulting in asymmetric irradiation of the two electrodes and generating a photovoltage with directions determined by the chirality of the incident light field. The proposed design strategy facilitates ultra-compact CPL detection across diverse materials, structures, and spectral ranges, presenting a novel avenue for achieving high-performance monolithic CPL detection.

偏振态的片上测量在现代传感和成像应用中发挥着越来越重要的作用。虽然高性能单片线偏振光电探测器已得到广泛研究，但集成圆偏振光 (CPL) 光电探测器仍然因辨别能力不足而受到阻碍。这项研究提出了一种利用非手性全电介质纳米结构的宽带 CPL 光电探测器，在 405 nm 波长下实现了约 107 的令人印象深刻的辨别比。我们的设备在可见光波段表现出出色的 CPL 辨别能力，无需强度校准。它的功能基于非手性结构内依赖于 CPL 的近场模式：在左或右 CPL 照明下，不同的近场模式被激发，导致两个电极的不对称照射，并产生方向由手性决定的光电压。入射光场。所提出的设计策略促进了跨不同材料、结构和光谱范围的超紧凑 CPL 检测，为实现高性能单片 CPL 检测提供了一种新途径。