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Effect of gamma and ultraviolet irradiation on the optical properties of copper oxide nanostructured thin films by chemical spray pyrolysis
Radiation Physics and Chemistry ( IF 2.8 ) Pub Date : 2024-09-10 , DOI: 10.1016/j.radphyschem.2024.112190
Mushtaq Abed Al-Jubbori , Omar Ayed , Khalaf Ajaj

Nanostructured copper oxide thin films were grown by the chemical spray pyrolysis (CSP) technique. Utilizing a homemade spray pyrolysis method, thin films are created. This work investigates the role of gamma ray and ultraviolet ray irradiation on the optical properties of copper oxide thin films(CuO) prepared. In this framework, used different substrate temperatures 300 °C, 350 °C, and 400 °C for the layers were grown on glass for the prepared CuO thin films. UV–visible spectrometer, field emission scanning electron microscopy (FE-SEM) and X-ray diffraction patterns(XRD) measurements were all used to characterize the samples. The UV–visible spectroscopy showed a decrease in the absorbance and the optical band gap of CuO thin films with the increase in the higher substrate temperatures before irradiation. Additionally, surface plasmon resonance peaks (λSPR) were observed at 329 nm. FE-SEM images revealed spherical-like shapes with an average diameter range of 48 nm,56 nm and 62 nm for 300 °C, 350 °C, and 400 °C, respectively. An analysis of X-rays revealed that CuO thin films contained the crystallographic planes of a monoclinic and an orthorhombic crystal system. Also, when samples were exposed to gamma and UVC radiation, the absorbance intensity of CuO thin films increased, but the optical band gap decreased.

中文翻译:


γ 和紫外辐照对化学喷雾热解氧化铜纳米结构薄膜光学性能的影响



纳米结构氧化铜薄膜通过化学喷雾热解 (CSP) 技术生长。利用自制的喷雾热解方法,形成薄膜。本工作研究了伽马射线和紫外射线辐照对制备的氧化铜薄膜 (CuO) 光学性能的影响。在这个框架中,使用不同的衬底温度 300 °C、350 °C 和 400 °C 在玻璃上生长的层,用于制备的 CuO 薄膜。紫外-可见光谱仪、场发射扫描电子显微镜 (FE-SEM) 和 X 射线衍射图 (XRD) 测量均用于表征样品。紫外-可见光谱显示,随着照射前较高衬底温度的增加,CuO 薄膜的吸光度和光学带隙降低。此外,在 329 nm 处观察到表面等离子体共振峰 (λSPR)。FE-SEM 图像显示球形,在 300 °C、350 °C 和 400 °C 下的平均直径范围分别为 48 nm、56 nm 和 62 nm。对 X 射线的分析表明,CuO 薄膜包含单斜晶系和斜方晶系的晶体平面。此外,当样品暴露于 γ 和 UVC 辐射时,CuO 薄膜的吸光度强度增加,但光学带隙减小。
更新日期:2024-09-10
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