Charging and Mobilization of Dust Particles on a Surface in Plasma,Physical Review Letters

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Charging and Mobilization of Dust Particles on a Surface in Plasma
Physical Review Letters ( IF 8.1 ) Pub Date : 2024-09-11 , DOI: 10.1103/physrevlett.133.115301
José H. Pagán Muñoz _{1,

1} , Xu Wang _{1,

1} , Mihály Horányi _{1,

1} , Vladimir Kvon ₂ , Luuk Heijmans ₂ , Manis Chaudhuri ₂ , Mark van de Kerkhof ₂ , Andrei M. Yakunin ₂ , Pavel Krainov ₃ , Dmitry Astakhov ₃

Affiliation

We present first experimental results showing that single dust particles on a dielectric surface are mobilized and lofted due to exposure to an electron beam or ultraviolet radiation. It is shown that secondary electrons and/or photoelectrons emitted from a substrate surface are recollected on the surfaces within microcavities between a dust particle and the substrate surface, resulting in large negative charges and subsequently causing mobilization of the dust particle due to Coulomb repulsion. Dust mobility tested against the electron beam energy is shown to follow the secondary electron yield curve of the substrate surface in both the experimental and modeling results. The results verified the role of emitted electrons from the substrate surface in charging and mobilization of single dust particles.

中文翻译：

等离子体表面灰尘颗粒的充电和移动

我们提出的第一个实验结果表明，由于暴露于电子束或紫外线辐射，介电表面上的单个灰尘颗粒被移动和飘浮。结果表明，从基底表面发射的二次电子和/或光电子在灰尘颗粒和基底表面之间的微腔内的表面上被重新收集，导致大量负电荷，并且随后由于库仑排斥而引起灰尘颗粒的移动。在实验和建模结果中，针对电子束能量测试的灰尘迁移率显示出遵循基底表面的二次电子产率曲线。结果验证了基材表面发射的电子在单个灰尘颗粒的充电和移动中的作用。

更新日期：2024-09-12

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