This study introduces a new approach to optimizing graphene oxide (GO) properties using liquid-phase plasma treatment in a microenvironment. Our innovation exploits atomic force microscopy (AFM) cantilever frequency tracking to monitor mass variations in GO, which are indicative of surface oxidation–reduction processes or substituent doping (boron/nitrogen). Complementary in situ Raman spectroscopy has observed D/G band shifts, and X-ray photoelectron spectroscopy (XPS) determined the C/O ratio and B/N doping levels pre- and post-treatment, confirming chemical tuning to GO. We can achieve femtogram-level precision in detecting nanomaterial mass changes by correlating elemental ratios with AFM cantilever frequency measurements. This multifaceted approach not only enhances our understanding of the chemical properties of GO but also establishes a new, versatile method for monitoring, modifying, and optimizing the properties of nanomaterials.

中文翻译：

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用于动态氧化石墨烯纳米片监测的飞克敏感悬臂平台


这项研究介绍了一种在微环境中使用液相等离子体处理来优化氧化石墨烯（GO）性能的新方法。我们的创新利用原子力显微镜 (AFM) 悬臂频率跟踪来监测 GO 中的质量变化，这表明表面氧化还原过程或取代基掺杂（硼/氮）。互补的原位拉曼光谱观察到了 D/G 带位移，X 射线光电子能谱 (XPS) 确定了处理前后的 C/O 比和 B/N 掺杂水平，证实了对 GO 的化学调谐。通过将元素比率与 AFM 悬臂梁频率测量相关联，我们可以在检测纳米材料质量变化方面实现飞克级精度。这种多方面的方法不仅增强了我们对GO化学性质的理解，而且建立了一种新的、通用的方法来监测、修改和优化纳米材料的性质。