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Wide-field full-Stokes polarimetry for conical light based on all-dielectric metasurface
Journal of Materiomics ( IF 8.4 ) Pub Date : 2024-06-12 , DOI: 10.1016/j.jmat.2024.05.008 Qing Luo , Xiaoshao Ma , Yang Guo , Yang Zhou , Junwei Ma , Weihao Yang , Longjiang Deng , Lei Bi , Jun Qin
Journal of Materiomics ( IF 8.4 ) Pub Date : 2024-06-12 , DOI: 10.1016/j.jmat.2024.05.008 Qing Luo , Xiaoshao Ma , Yang Guo , Yang Zhou , Junwei Ma , Weihao Yang , Longjiang Deng , Lei Bi , Jun Qin
Polarization camera based on CMOS sensor and nano wire-grid technology have found widespread applications in medical diagnostics, remote sensing and industrial inspection. However, the limited filtering properties of wire-grid polarizers and the small field-of-view provided by conventional microlens restrict the energy efficiency of these systems while also increasing their cost, size and weight. In this study, we propose an innovative approach that integrates focusing and splitting of polarization states into a single-layer all-dielectric metasurface. This metasurface enables full-Stokes polarization imaging for a wide field-of-view conical light. The design of the metasurface utilizes a phase compensation method to effectively focus orthogonal polarized conical light onto the central pixel of the CMOS sensor. Theoretical analysis demonstrates that this metasurface can accurately detect full-Stokes parameters within ±20° incident cone angles with an average efficiency reaching 83.0%. The angle can be extended to ±90° with an average efficiency exceeding 80%. We fabricated a three super-pixel metasurface prototype, and experimental measurements reveal its ability to efficiently focus and split three pairs of orthogonal polarization states under ±11° conical angle incidence with an average focusing efficiency of 68.1%. This study presents a promising solution for achieving wide field-of-view and high-efficiency polarization detection in integrated CMOS systems.
中文翻译:
基于全介电超表面的锥形光宽视场全斯托克斯偏振法
基于 CMOS 传感器和纳米线栅技术的偏振相机已在医疗诊断、遥感和工业检测中得到广泛应用。然而,线栅偏振片的有限过滤特性和传统微透镜提供的小视场限制了这些系统的能源效率,同时也增加了它们的成本、尺寸和重量。在这项研究中,我们提出了一种创新方法,将极化态的聚焦和分裂集成到单层全介电超表面中。这种超表面可实现宽视场锥形光的全斯托克斯偏振成像。超表面的设计利用相位补偿方法将正交偏振锥形光有效地聚焦到 CMOS 传感器的中心像素上。理论分析表明,该超表面可以准确检测 ±20° 入射锥角内的全斯托克斯参数,平均效率达到 83.0%。角度可延伸至 ±90°,平均效率超过 80%。我们制造了一个 3 超像素超表面原型,实验测量表明其在 ±1° 锥形角入射下能够有效聚焦和分裂三对正交偏振态,平均聚焦效率为 68.1%。本研究为在集成 CMOS 系统中实现宽视场和高效偏振检测提供了一种有前途的解决方案。
更新日期:2024-06-12
中文翻译:
基于全介电超表面的锥形光宽视场全斯托克斯偏振法
基于 CMOS 传感器和纳米线栅技术的偏振相机已在医疗诊断、遥感和工业检测中得到广泛应用。然而,线栅偏振片的有限过滤特性和传统微透镜提供的小视场限制了这些系统的能源效率,同时也增加了它们的成本、尺寸和重量。在这项研究中,我们提出了一种创新方法,将极化态的聚焦和分裂集成到单层全介电超表面中。这种超表面可实现宽视场锥形光的全斯托克斯偏振成像。超表面的设计利用相位补偿方法将正交偏振锥形光有效地聚焦到 CMOS 传感器的中心像素上。理论分析表明,该超表面可以准确检测 ±20° 入射锥角内的全斯托克斯参数,平均效率达到 83.0%。角度可延伸至 ±90°,平均效率超过 80%。我们制造了一个 3 超像素超表面原型,实验测量表明其在 ±1° 锥形角入射下能够有效聚焦和分裂三对正交偏振态,平均聚焦效率为 68.1%。本研究为在集成 CMOS 系统中实现宽视场和高效偏振检测提供了一种有前途的解决方案。