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An Efficient Characterization Method to Predict the Susceptibility of Integrated Circuits to Multitone Disturbance
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-09-04 , DOI: 10.1109/temc.2024.3448495 Alexandre Boyer 1 , Fabrice Caignet 1 , Matthieu Laidet 1
中文翻译：
预测集成电路对多音干扰敏感性的有效表征方法
更新日期：2024-09-04
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-09-04 , DOI: 10.1109/temc.2024.3448495 Alexandre Boyer 1 , Fabrice Caignet 1 , Matthieu Laidet 1
Affiliation
中文翻译：
预测集成电路对多音干扰敏感性的有效表征方法
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