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In-operando microwave scattering-parameter calibrated measurement of a Josephson traveling wave parametric amplifier
Applied Physics Letters ( IF 3.5 ) Pub Date : 2024-09-03 , DOI: 10.1063/5.0220776
S.-H. Shin 1, 2 , M. Stanley 1 , W. N. Wong 1 , T. Sweetnam 1 , A. Elarabi 1 , T. Lindström 1 , N. M. Ridler 1 , S. E. de Graaf 1
Affiliation  

Superconducting traveling wave parametric amplifiers (TWPAs) are broadband near-quantum limited microwave amplifiers commonly used for qubit readout and a wide range of other applications in quantum technologies. The performance of these amplifiers depends on achieving impedance matching to minimize reflected signals. Here, we apply a microwave calibration technique to extract the S-parameters of a Josephson junction based TWPA in-operando. This enables reflections occurring at the TWPA and its extended network of components to be quantified, and we find that the in-operation performance can be well described by the off-state measured S-parameters.

中文翻译:


Josephson 行波参量放大器的原位微波散射参数校准测量



超导行波参量放大器 (TWPA) 是宽带近量子极限微波放大器,通常用于量子比特读出和量子技术中的各种其他应用。这些放大器的性能取决于实现阻抗匹配,以最大限度地减少反射信号。在这里,我们应用微波校准技术来提取基于 Josephson 结的 TWPA 操作符的 S 参数。这使得 TWPA 及其扩展组件网络处发生的反射可以被量化,我们发现运行中的性能可以用关断状态测量的 S 参数很好地描述。
更新日期:2024-09-03
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