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Characterization and Application of Improved Oscilloscope IC for System Diagnosis of ESD and HPEM Effects
IEEE Transactions on Electromagnetic Compatibility ( IF 2.0 ) Pub Date : 2024-09-02 , DOI: 10.1109/temc.2024.3448361
Kyunghoon Lee 1 , Sangyeong Jeong 1 , Wooshin Choi 2 , Jung-Hwan Choi 2 , Jingook Kim 1
Affiliation  



中文翻译:


用于 ESD 和 HPEM 效应系统诊断的改进示波器 IC 的表征和应用


更新日期:2024-09-02
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