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In-Situ Detection of Bond Wire Lift-Off Events in Operational SiC MOSFETs
IEEE Transactions on Power Electronics ( IF 6.6 ) Pub Date : 2024-08-21 , DOI: 10.1109/tpel.2024.3446750 Furkan Karakaya , Anuj Maheshwari , Arijit Banerjee , John S. Donnal , Adam J. Morgan , Woongje Sung
中文翻译:
运行 SiC MOSFET 中键合线剥离事件的原位检测
更新日期:2024-08-21
IEEE Transactions on Power Electronics ( IF 6.6 ) Pub Date : 2024-08-21 , DOI: 10.1109/tpel.2024.3446750 Furkan Karakaya , Anuj Maheshwari , Arijit Banerjee , John S. Donnal , Adam J. Morgan , Woongje Sung
中文翻译:
运行 SiC MOSFET 中键合线剥离事件的原位检测