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Evolution of Classical 1-D Based Models and Improved Approach for the Characterization of Litz Wire Losses
IEEE Transactions on Power Electronics ( IF 6.6 ) Pub Date : 2024-08-21 , DOI: 10.1109/tpel.2024.3446962 Asier Arruti 1 , Iosu Aizpuru 1 , Mikel Mazuela 1 , Ziwei Ouyang 2 , Michael A.E. Andersen 2
中文翻译：
经典一维模型的演变和利兹线损耗表征的改进方法
更新日期：2024-08-21
IEEE Transactions on Power Electronics ( IF 6.6 ) Pub Date : 2024-08-21 , DOI: 10.1109/tpel.2024.3446962 Asier Arruti 1 , Iosu Aizpuru 1 , Mikel Mazuela 1 , Ziwei Ouyang 2 , Michael A.E. Andersen 2
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中文翻译：
经典一维模型的演变和利兹线损耗表征的改进方法
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