An ever-present limitation of transmission electron microscopy is the damage caused by high-energy electrons interacting with any sample. By reconsidering the fundamentals of imaging, we demonstrate an event-responsive approach to electron microscopy that delivers more information about the sample for a given beam current. Measuring the time to achieve an electron count threshold rather than waiting a predefined constant time improves the information obtained per electron. The microscope was made to respond to these events by blanking the beam, thus reducing the overall dose required. This approach automatically apportions dose to achieve a given signal-to-noise ratio in each pixel, eliminating excess dose that is associated with diminishing returns of information. We demonstrate the wide applicability of our approach to beam-sensitive materials by imaging biological tissue and zeolite.

中文翻译：

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事件响应扫描透射电子显微镜


透射电子显微镜始终存在的局限性是高能电子与任何样品相互作用造成的损坏。通过重新考虑成像的基本原理，我们展示了一种事件响应的电子显微镜方法，可以在给定的束流下提供有关样品的更多信息。测量达到电子计数阈值的时间而不是等待预定义的恒定时间可以提高每个电子获得的信息。显微镜通过消隐光束来响应这些事件，从而减少所需的总剂量。这种方法自动分配剂量，以在每个像素中实现给定的信噪比，从而消除与信息回报递减相关的过量剂量。我们通过对生物组织和沸石成像来证明我们的方法对光束敏感材料的广泛适用性。