The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright field by motorized apertures in the back focal plane of the objective lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale.

中文翻译：

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全视场透射 X 射线显微镜中的纳米级暗视场成像


暗场信号揭示了传统 X 射线衰减对比度之外的细节，这对于材料科学尤其有价值。特别是，暗场技术能够揭示超出装置空间分辨率的结构。然而，其实施仅限于微米范围。因此，我们提出了一种通过暗场信号扩展全场透射 X 射线显微镜的技术。所提出的方法基于光束整形聚光镜的明确照明，该聚光镜允许通过物镜后焦平面中的电动光圈来阻挡亮场。该方法实现简单，能够快速改变模态，同时保持较短的扫描时间，从而使暗场成像在纳米尺度上广泛应用。