Heterodyne High-Harmonic Electrostatic Force Microscopy with Improved Spatial Resolution for Nanoscale Identification of Metallic/Semiconducting Carbon Nanotubes,ACS Applied Materials & Interfaces

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Heterodyne High-Harmonic Electrostatic Force Microscopy with Improved Spatial Resolution for Nanoscale Identification of Metallic/Semiconducting Carbon Nanotubes
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2024-07-23 , DOI: 10.1021/acsami.4c08163
Kunqi Xu _{1,

2} , Yufeng Xie _{1,

2} , Saiqun Ma _{1,

2} , Qi Liang _{1,

2,

3} , Zhiwen Shi _{1,

2,

3}

Affiliation

There are two main types of carbon nanotubes (CNTs): metallic and semiconducting. Naturally grown CNTs are randomly distributed, posing challenges in distinguishing between the two types. Here, a novel approach for nanoscale high-resolution imaging and identification of CNTs was introduced by incorporating the heterodyne technique into high-harmonic electrostatic force microscopy (HH-EFM) on an atomic force microscopy (AFM) platform. In the developed heterodyne HH-EFM, a more localized high-order gradient of tip–sample nonlinear interaction force is used as signal channels, resulting in an improved spatial resolution, compared to the conventional HH-EFM. Furthermore, the heterodyne HH-EFM also has the capability to visualize material carrier density and assess qualitative carrier transport performance. Our work not only presents a new approach to identifying/exploring electrical properties of low-dimensional nanomaterials but also provides a solution for optimizing resolution in long-range interaction-based functional AFM technologies.

中文翻译：

具有改进的空间分辨率的外差高次谐波静电力显微镜用于金属/半导体碳纳米管的纳米级识别

碳纳米管 (CNT) 主要有两种类型：金属碳纳米管和半导体碳纳米管。自然生长的碳纳米管是随机分布的，这给区分这两种类型带来了挑战。在这里，通过将外差技术结合到原子力显微镜（AFM）平台上的高次谐波静电力显微镜（HH-EFM）中，引入了一种纳米级高分辨率成像和识别碳纳米管的新方法。与传统的 HH-EFM 相比，在开发的外差 HH-EFM 中，尖端-样品非线性相互作用力的更局部化的高阶梯度被用作信号通道，从而提高了空间分辨率。此外，外差 HH-EFM 还能够可视化材料载流子密度并评估定性载流子传输性能。我们的工作不仅提出了一种识别/探索低维纳米材料电特性的新方法，而且还提供了一种优化基于长程相互作用的功能 AFM 技术分辨率的解决方案。

更新日期：2024-07-23

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