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Non-contact thermometer for measuring surface temperature of photothermal catalysts using near-infrared black-body radiation spectrum
Device Pub Date : 2024-07-25 , DOI: 10.1016/j.device.2024.100467 Meiraba Chirom , Chengzhen Qin , Feng Lin , Aniqa Lim , Steven Baldelli , Francisco Robles-Hernandez , Dong Liu , Viktor G. Hadjiev , Xiaonan Shan , Stacey Louie , Jiming Bao
Device Pub Date : 2024-07-25 , DOI: 10.1016/j.device.2024.100467 Meiraba Chirom , Chengzhen Qin , Feng Lin , Aniqa Lim , Steven Baldelli , Francisco Robles-Hernandez , Dong Liu , Viktor G. Hadjiev , Xiaonan Shan , Stacey Louie , Jiming Bao
Electrons with energies higher than the thermal distribution, also known as hot electrons, can help reduce activation energy and improve selectivity in photothermal catalysis. To better understand this process, one needs to measure the non-thermal contributions, which requires accurately determining the catalysts’ temperature. We present a non-contact optical technique for measuring the surface temperature of catalysts. This technique utilizes a spectrometer to measure the near-infrared (NIR) emission spectrum (950–1,600 nm). Since the measurement does not rely on black-body emission intensity alone, it does not suffer from temperature-dependent emissivity and other related issues. The NIR thermometer can achieve an accuracy of 1°C at 200°C and above. The use of NIR continuous spectral fitting can help understand non-thermal contributions in photothermal reactions and solve problems in fields where accurate high surface temperature measurement is required.
中文翻译:
利用近红外黑体辐射光谱测量光热催化剂表面温度的非接触式温度计
能量高于热分布的电子,也称为热电子,有助于降低光热催化的活化能并提高选择性。为了更好地理解这一过程,需要测量非热贡献,这需要准确确定催化剂的温度。我们提出了一种用于测量催化剂表面温度的非接触式光学技术。该技术利用光谱仪测量近红外 (NIR) 发射光谱 (950–1,600 nm)。由于测量不仅仅依赖于黑体发射强度,因此它不会受到温度相关发射率和其他相关问题的影响。 NIR 温度计在 200°C 及以上的温度下可达到 1°C 的精度。使用近红外连续光谱拟合可以帮助了解光热反应中的非热贡献,并解决需要精确的高表面温度测量的领域的问题。
更新日期:2024-07-25
中文翻译:
利用近红外黑体辐射光谱测量光热催化剂表面温度的非接触式温度计
能量高于热分布的电子,也称为热电子,有助于降低光热催化的活化能并提高选择性。为了更好地理解这一过程,需要测量非热贡献,这需要准确确定催化剂的温度。我们提出了一种用于测量催化剂表面温度的非接触式光学技术。该技术利用光谱仪测量近红外 (NIR) 发射光谱 (950–1,600 nm)。由于测量不仅仅依赖于黑体发射强度,因此它不会受到温度相关发射率和其他相关问题的影响。 NIR 温度计在 200°C 及以上的温度下可达到 1°C 的精度。使用近红外连续光谱拟合可以帮助了解光热反应中的非热贡献,并解决需要精确的高表面温度测量的领域的问题。