The nanoscale topographic features of surfaces, such as vertical, lateral, and multiscale structures, are essential for understanding and identifying correlations with properties in various applications. These features are critical in applications ranging from biomedical devices to electronic components, as they play a significant role in determining the functionality of these systems. Despite the capabilities of traditional surface analysis methods, which rely on standard vertical profile and area measurements, these techniques often fail to capture the subtle and specific features that differentiate between surfaces with different morphologies. To address this challenge, this paper proposes applying of a topological data analysis of atomic force microscopy data to create a unique topological signature for each surface. This approach can help us better understand complex relationships between topography and functional characteristics in various applications and enable further advanced surface comparison.

中文翻译：

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通过拓扑数据分析描述纳米结构表面原子力显微镜数据的新指标


表面的纳米级形貌特征，例如垂直、横向和多尺度结构，对于理解和识别各种应用中特性的相关性至关重要。这些功能在从生物医学设备到电子元件的应用中至关重要，因为它们在确定这些系统的功能方面发挥着重要作用。尽管依赖于标准垂直轮廓和面积测量的传统表面分析方法具有一定的功能，但这些技术通常无法捕获区分不同形态表面的微妙和特定特征。为了应对这一挑战，本文提出应用原子力显微镜数据的拓扑数据分析来为每个表面创建独特的拓扑特征。这种方法可以帮助我们更好地理解各种应用中地形和功能特性之间的复杂关系，并实现进一步高级的表面比较。