Bioelectronic implants in the deep brain provide the opportunity to monitor deep brain activity with potential applications in disease diagnostics and treatment. However, mechanical mismatch between a probe and brain tissue can cause surgical trauma in the brain and limit chronic probe-based monitoring, leading to performance degradation. Here, we report a transient shuttle-based probe consisting of a PVA and a mesh-type probe. A rigid shuttle based on PVA implants an ultrathin mesh probe in the target deep brain without a tangle, while creating both a sharp edge for facile penetration into the brain and an anti-friction layer between the probe and brain tissue through dissolving its surface. The capability to shuttle dissolved materials can exclude the retracted process of the shuttle in the brain. Complete dissolution of the shuttle provides a dramatic decrease (~1078-fold) in the stiffness of the probe, which can therefore chronically monitor a wide area of the brain. These results indicate the ability to use a simplistic design for implantation of wide and deep brain probes while preventing unnecessary damage to the brain and probe degradation during long-term use.

深部大脑中的生物电子植入物提供了监测深部大脑活动的机会，并在疾病诊断和治疗中具有潜在的应用。然而，探头和脑组织之间的机械不匹配可能会导致大脑手术创伤，并限制基于探头的长期监测，导致性能下降。在这里，我们报告了一种由 PVA 和网状探针组成的瞬态穿梭探针。基于PVA的刚性梭子将超薄网状探针无缠结地植入目标脑深部，同时在探针和脑组织之间形成锋利的边缘以方便刺入大脑，并通过溶解其表面在探针和脑组织之间形成抗摩擦层。穿梭溶解物质的能力可以排除穿梭在大脑中的回缩过程。梭子的完全溶解使探针的刚度显着降低（约1078倍），因此可以长期监测大脑的大范围区域。这些结果表明能够使用简单的设计来植入宽而深的脑部探针，同时防止长期使用过程中对大脑造成不必要的损伤以及探针的退化。