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Long-Tailed Defects Classification Based on Probabilistic Aggregation Network for Light-Emitting Diode Packaging Process
IEEE Transactions on Industrial Informatics ( IF 11.7 ) Pub Date : 2024-07-01 , DOI: 10.1109/tii.2024.3413982 Jiajun Chen 1 , Hongpeng Yin 1 , Yan Qin 1 , Weijie Jiang 1
中文翻译：
基于概率聚合网络的发光二极管封装工艺长尾缺陷分类
更新日期：2024-07-01
IEEE Transactions on Industrial Informatics ( IF 11.7 ) Pub Date : 2024-07-01 , DOI: 10.1109/tii.2024.3413982 Jiajun Chen 1 , Hongpeng Yin 1 , Yan Qin 1 , Weijie Jiang 1
Affiliation
中文翻译：
基于概率聚合网络的发光二极管封装工艺长尾缺陷分类
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