The optical characteristics of one-dimensional (1D) MoS₂ edges and folds at the grain level, acting as interfaces in diverse optoelectronic applications, remain unexplored in contrast to the basal plane. In this study, we utilize dark-field hyperspectral microscopy (DFHM) to investigate the optical properties of individual edges and folds in MoS₂ synthesized by chemical vapor deposition. Through DFHM, spatiospectral scattering information about these features is acquired. Comparative analysis with complementary reflection hyperspectral microscopy reveals red shifts in transitions on the edge spectrum of single-layered MoS₂, regardless of the edge types, attributed to lattice strain and edge defects. Deconvolution of the edge spectrum unveils an increased contribution from the indirect band gap. The polarized DFHM experiment exhibits 1D scattering behavior along edges. An increase in the number of MoS₂ layers leads to a reduction in the degree of red shift and the intensity of the scatter, correlated with the decreased roughness of the edge surface. Additionally, MoS₂ folds also exhibited scattering behaviors influenced by the twisted bilayer structure. The DFHM method will be a valuable approach to gain insights into the structure–property relationships at the interfaces of various low-dimensional nanomaterials.

中文翻译：

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使用暗场高光谱显微镜观察 MoS2 边缘和折叠的散射特性


与基面相比，一维 (1D) MoS ₂ 边缘和颗粒水平折叠的光学特性在各种光电应用中充当界面，尚未得到探索。在本研究中，我们利用暗场高光谱显微镜 (DFHM) 研究化学气相沉积合成的 MoS ₂ 中各个边缘和折叠的光学特性。通过 DFHM，可以获得有关这些特征的空间光谱散射信息。与互补反射高光谱显微镜的比较分析揭示了单层MoS ₂ 边缘光谱跃迁的红移，无论边缘类型如何，归因于晶格应变和边缘缺陷。边缘光谱的反卷积揭示了间接带隙的贡献增加。偏振 DFHM 实验表现出沿边缘的一维散射行为。 MoS ₂ 层数的增加导致红移程度和散射强度的降低，与边缘表面粗糙度的降低相关。此外，MoS ₂ 折叠还表现出受扭曲双层结构影响的散射行为。 DFHM 方法将是深入了解各种低维纳米材料界面的结构-性能关系的一种有价值的方法。