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Degradation State Assessment of IGBT Module Based on Interpretable LSTM-AE Modeling Under Changing Working Conditions
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-06-24 , DOI: 10.1109/jestpe.2024.3419042 Feng Xie 1 , Fei Xiao 1 , Xin Tang 1 , Yifei Luo 1 , Haolan Shen 1 , Zenan Shi 2
中文翻译：
基于可解释的 LSTM-AE 建模的变化工作条件下 IGBT 模块的退化状态评估
更新日期：2024-06-24
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 2024-06-24 , DOI: 10.1109/jestpe.2024.3419042 Feng Xie 1 , Fei Xiao 1 , Xin Tang 1 , Yifei Luo 1 , Haolan Shen 1 , Zenan Shi 2
Affiliation
中文翻译：
基于可解释的 LSTM-AE 建模的变化工作条件下 IGBT 模块的退化状态评估
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