In recent years, the technical capabilities of high-resolution Scanning Electron Microscopes (SEM) improved significantly. To fully utilise their potential, it is crucial that also the preparation techniques are advanced to obtain a high-quality surface which preserves even nanometre sized microstructural features. In this study, state-of-the-art resin-embedded polishing, and novel Broad Ion Beam (BIB) milling of hydrated cement paste are compared. SEM microstructural investigations are aided by image processing to determine porosity and pore geometry factors. Additionally, a comprehensive quantitative surface roughness analysis based on Atomic Force Microscopy scans is carried out. BIB-milling enabled the study of nanoscale features such as gel porosity or the acicular morphology of calcium-silicate-hydrates. Pores exhibit increased aspect ratios whereas resin-embedded polishing results in higher circularity. However, a superior vertical surface roughness was achieved by the resin-embedded polishing approach. The research highlights the advantages and drawbacks of BIB-milling as a polishing method for hydrated cement pastes.

中文翻译：

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宽离子束抛光对水化水泥浆体表面粗糙度的影响及其对微观结构分析的影响


近年来，高分辨率扫描电子显微镜（SEM）的技术能力显着提高。为了充分利用它们的潜力，至关重要的是先进的制备技术以获得高质量的表面，甚至保留纳米级的微观结构特征。在这项研究中，比较了最先进的树脂嵌入抛光和新型宽离子束 (BIB) 水合水泥浆铣削。 SEM 微观结构研究借助图像处理来确定孔隙率和孔隙几何形状因素。此外，还进行了基于原子力显微镜扫描的全面定量表面粗糙度分析。 BIB 研磨能够研究纳米级特征，例如凝胶孔隙率或硅酸钙水合物的针状形态。孔隙表现出增加的纵横比，而树脂嵌入抛光则导致更高的圆度。然而，通过树脂嵌入抛光方法实现了优异的垂直表面粗糙度。该研究强调了 BIB 研磨作为水化水泥浆体抛光方法的优点和缺点。