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Improved power semiconductor dynamic testing circuit to suppress leakage current
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 5-20-2024 , DOI: 10.1109/jestpe.2024.3403105 Xiaoshuang Hui 1 , Puqi Ning 1 , Dan Zheng 2 , Tao Fan 1 , Kai Wang 2 , Yunhui Mei 3
中文翻译：
改进功率半导体动态测试电路以抑制漏电流
更新日期：2024-08-19
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 5-20-2024 , DOI: 10.1109/jestpe.2024.3403105 Xiaoshuang Hui 1 , Puqi Ning 1 , Dan Zheng 2 , Tao Fan 1 , Kai Wang 2 , Yunhui Mei 3
Affiliation
中文翻译：
改进功率半导体动态测试电路以抑制漏电流
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