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An Online Correction Method for Inaccuracy of Junction Temperature Monitoring Caused by Degradation of SiC MOSFETs
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 5-17-2024 , DOI: 10.1109/jestpe.2024.3402225 Ziyang Zhang 1 , Lin Liang 1 , Haoyang Fei 1 , Lubin Han 1 , Hai Shang 1
中文翻译：
一种针对 SiC MOSFET 退化导致的结温监测不准确的在线校正方法
更新日期：2024-08-19
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 4.6 ) Pub Date : 5-17-2024 , DOI: 10.1109/jestpe.2024.3402225 Ziyang Zhang 1 , Lin Liang 1 , Haoyang Fei 1 , Lubin Han 1 , Hai Shang 1
Affiliation
中文翻译：
一种针对 SiC MOSFET 退化导致的结温监测不准确的在线校正方法
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