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Chiral Structure Determination of Aligned Single-Walled Carbon Nanotubes on Graphite Surface
Nano Letters ( IF 9.6 ) Pub Date : 2013-10-25 00:00:00 , DOI: 10.1021/nl403336x
Yabin Chen 1 , Yue Hu 1 , Mengxi Liu 1 , Weigao Xu 1 , Yanfeng Zhang 1 , Liming Xie 2 , Jin Zhang 1
Affiliation  

Chiral structure determination of single-walled carbon nanotube (SWNT), including its handedness and chiral index (n,m), has been regarded as an intractable issue for both fundamental research and practical application. For a given SWNT, the n and m values can be conveniently deduced if an arbitrary two of its three crucial structural parameters, that is, diameter d, chiral angle θ, and electron transition energy Eii, are obtained. Here, we have demonstrated a novel approach to derive the (n,m) indices from the θ, d, and Eii of SWNTs. Handedness and θ were quickly measured based on the chirality-dependent alignment of SWNTs on graphite surface. By combining their measured d and Eii, (n,m) indices of SWNTs can be independently and uniquely identified from the (θ,d) or (θ,Eii) plots, respectively. This approach offers intense practical merits of high-efficiency, low-cost, and simplicity.

中文翻译:

石墨表面排列的单壁碳纳米管的手性结构测定

单壁碳纳米管(SWNT)的手性结构测定,包括其手性和手性指数(nm),已被认为是基础研究和实际应用都难以解决的问题。对于给定的SWNT,如果获得其三个关键结构参数中的任意两个,即直径d,手性角θ和电子跃迁能E ii,则可以方便地推导出nm值。在这里,我们展示了一种从θ,dE ii导出(nm)指数的新颖方法。的SWNT。基于SWNT在石墨表面上的手性依赖性排列,可以快速测量手感和θ。通过组合其测得的dE ii,可以分别从(θ,d)或(θ,E ii)图中独立和唯一地标识SWNT的(nm)指数。这种方法具有高效,低成本和简单的强大实用价值。
更新日期:2013-10-25
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