Time-bin (TB) and energy-time (ET) entanglements are crucial resources for long-distance quantum information processing. However, their standard implementations suffer from the so-called post-selection loophole that allows for classical simulation and thus prevents quantum advantage. The post-selection loophole has been addressed in proof-of-principle experiments. An open problem though is to close it in real-life applications based on integrated technologies. This is especially important since, so far, all integrated sources of TB and ET entanglements suffer from the post-selection loophole. Here, we report post-selection loophole-free certification of TB or ET entanglement in integrated technologies, by implementing in a silicon nitride chip the “hug” scheme [Phys. Rev. Lett. 102, 040401 (2009) [CrossRef] ] and certifying genuine TB entanglement through the violation of a Bell inequality.

中文翻译：

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集成光子学的实验后选择无漏洞时间仓和能量时间非局域性

时间仓（TB）和能量时间（ET）纠缠是长距离量子信息处理的关键资源。然而，它们的标准实现存在所谓的后选择漏洞，该漏洞允许经典模拟，从而阻止量子优势。选择后的漏洞已在原理验证实验中得到解决。然而，一个悬而未决的问题是在基于集成技术的现实应用中关闭它。这一点尤其重要，因为到目前为止，所有 TB 和 ET 纠缠的综合来源都受到后选择漏洞的影响。在这里，我们通过在氮化硅芯片中实施“拥抱”方案，报告了集成技术中 TB 或 ET 纠缠的选择后无漏洞认证。莱特牧师。102 , 040401 (2009) [CrossRef] ] 并通过违反贝尔不等式证明真正的结核病缠结。