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Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High-Voltage NMC811||SiOx-Containing Cells via Operando ATR-FTIR Spectroscopy (Adv. Energy Mater. 5/2024)
Advanced Energy Materials ( IF 24.4 ) Pub Date : 2024-02-01 , DOI: 10.1002/aenm.202470022 Matthias Weiling 1 , Christian Lechtenfeld 2 , Felix Pfeiffer 1 , Lars Frankenstein 2 , Diddo Diddens 1 , Jian‐Fen Wang 1 , Sascha Nowak 2 , Masoud Baghernejad 1
Advanced Energy Materials ( IF 24.4 ) Pub Date : 2024-02-01 , DOI: 10.1002/aenm.202470022 Matthias Weiling 1 , Christian Lechtenfeld 2 , Felix Pfeiffer 1 , Lars Frankenstein 2 , Diddo Diddens 1 , Jian‐Fen Wang 1 , Sascha Nowak 2 , Masoud Baghernejad 1
Affiliation
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Additive Reductive Degradation
中文翻译：
通过 Operando ATR-FTIR 光谱了解高压 NMC811||含 SiOx 细胞中加成还原降解和 SEI 形成的机理 (Adv. Energy Mater. 5/2024)
加性还原降解
更新日期：2024-02-02
中文翻译：
通过 Operando ATR-FTIR 光谱了解高压 NMC811||含 SiOx 细胞中加成还原降解和 SEI 形成的机理 (Adv. Energy Mater. 5/2024)
加性还原降解
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