Materials Science in Semiconductor Processing ( IF 4.2 ) Pub Date : 2023-12-26 , DOI: 10.1016/j.mssp.2023.108054
S. Guru Bharath , G. Anandha Babu , C. Manikandan , E. Varadarajan
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The ternary 0.39Bi(Ni1/2Ti1/2)O3–0.20PbZrO3–0.41PbTiO3:x(Bi2O3/PbO) [x = 0, 1, and 2 wt%] ceramics were synthesized via solid-state sintering technique. The impact of excess addition on structural and electrical properties was investigated. PXRD results confirmed the diffusion of excess addition in the 0.39Bi(Ni1/2Ti1/2)O3–0.20PbZrO3–0.41PbTiO3 (BNPZT) lattice, exhibiting the perovskite structure with major rhombohedral (R3c) and minor tetragonal (P4mm) phases. The microstructure of the samples exhibits average grain size distribution (<8 μm). The temperature and frequency-dependent dielectric measurement revealed the relaxor-like ferroelectric behaviour and curie temperature (Tc ∼290 °C) observed in BNPZT:1 Pb ceramics. The improved remnant polarization (Pr∼23.47 μC/cm2) and coercive field (Ec ∼16.13 kV/cm) were obtained in BNPZT:2 Pb ceramics. The enhanced piezoelectric charge coefficient (d33 ∼ 496 pC/N) and maximum strain (Smax ∼0.12 %) were obtained for BNPZT. The least asymmetric factor (γs) illustrates the lower concentration of inherent defects in BNPZT:1(Bi/Pb) ceramics. This study provides insight into microstructural and electrical properties tuning and paves the way for designing piezoelectric materials.
中文翻译:

过量Bi2O3/PbO对三元0.39Bi(Ni1/2Ti1/2)O3–0.20PbZrO3–0.41PbTiO3陶瓷结构和电学性能的影响
三元 0.39Bi(Ni 1/2 Ti 1/2 )O 3 –0.20PbZrO 3 –0.41PbTiO 3 :x(Bi 2 O 3 /PbO) [x = 0、1 和 2 wt%] 陶瓷通过固态烧结技术。研究了过量添加对结构和电性能的影响。PXRD结果证实了过量添加物在0.39Bi(Ni 1/2 Ti 1/2 )O 3 –0.20PbZrO 3 –0.41PbTiO 3 (BNPZT)晶格中的扩散,呈现出主要菱面体( R3c )和次要四方晶格的钙钛矿结构(P4mm )阶段。样品的微观结构表现出平均晶粒尺寸分布(<8μm)。温度和频率相关的介电测量揭示了在 BNPZT:1 Pb 陶瓷中观察到的类弛豫铁电行为和居里温度 ( T c ∼290 °C )。BNPZT:2 Pb 陶瓷获得了改善的剩余极化(P r ∼ 23.47 μC/cm 2 )和矫顽场(E c ∼16. 13 kV/cm)。BNPZT 获得了增强的压电电荷系数(d 33 ∼ 496 pC/N)和最大应变(S max ∼0.12 % )。最小不对称因子 ( γ s ) 说明 BNPZT:1(Bi/Pb) 陶瓷中固有缺陷的浓度较低。这项研究提供了对微观结构和电性能调节的见解,并为设计压电材料铺平了道路。