当前位置: X-MOL 学术Surf. Coat. Technol. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Cu ions release and the formation of CuO/Cu2O during PEO based on the work function
Surface & Coatings Technology ( IF 5.3 ) Pub Date : 2023-12-24 , DOI: 10.1016/j.surfcoat.2023.130344
Haiyan Zou , Yamei Mao , Weifeng Qian , Binbin He , Yongnan Chen , Yazhe Xing , Qinyang Zhao , Guangrui Gao , Yufei Tang

The Cu ions release was investigated by the work function by scanning kelvin probe (SKP), and the formation of CuO/Cu2O was also researched by recording plasma discharges during plasma electrolytic oxidation (PEO) of Ti-14Cu alloy with different morphologies Ti2Cu phase. It is found that L-Ti2Cu phases with lower work function enhances the escape of Cu valence electrons from the 4 s energy level more easily compared to the G-Ti2Cu and GL-Ti2Cu phases. Consequently, this leads to earlier Cu ions released from L-Ti2Cu phases as opposed to the G-Ti2Cu and GL-Ti2Cu phases. The earlier Cu+ released from L-Ti2Cu phases increases the formation of Cu2O and further oxidizes into CuO with increasing voltage, which lead to the enhanced the relative content of CuO. This enhancement contributes to improving antibacterial activity and tribocorrosion resistance due to stress response and lubrication effect by high relative content of CuO. This research provides a theoretical reference for the metal ions release of Ti-14Cu alloy in oxidation dissolution process of PEO and the formation of corresponding metal oxides.



中文翻译:

基于功函数的 PEO 过程中 Cu 离子的释放和 CuO/Cu2O 的形成

通过扫描开尔文探针(SKP)的功函数研究了Cu离子的释放,并通过记录不同形貌Ti的Ti-14Cu合金在等离子体电解氧化(PEO)过程中的等离子体放电研究了CuO/Cu 2 O的形成。2 Cu相。研究发现,与G-Ti 2 Cu和GL-Ti 2 Cu相相比,具有较低功函数的L-Ti 2 Cu更容易增强Cu价电子从4s能级的逃逸。因此,与G-Ti 2 Cu和GL-Ti 2 Cu相相比,这导致更早地从L-Ti 2 Cu相中释放Cu离子。随着电压的增加,L-Ti 2 Cu相中较早释放的Cu +增加了Cu 2 O的形成并进一步氧化成CuO,从而导致CuO的相对含量增加。由于高相对含量的 CuO 的应力响应和润滑作用,这种增强有助于提高抗菌活性和耐摩擦腐蚀性。该研究为Ti-14Cu合金在PEO氧化溶解过程中金属离子的释放以及相应金属氧化物的形成提供了理论参考。

更新日期:2023-12-28
down
wechat
bug