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Interface-Tuning of Ferroelectricity and Quadruple-Well State in CuInP2S6 via Ferroelectric Oxide
ACS Nano ( IF 15.8 ) Pub Date : 2023-08-08 , DOI: 10.1021/acsnano.3c03567
Kun Wang 1 , Du Li 2 , Jia Wang 1 , Yifei Hao 1 , Hailey Anderson 1 , Li Yang 2 , Xia Hong 1
Affiliation  

Ferroelectric van der Waals CuInP2S6 possesses intriguing quadruple-well states and negative piezoelectricity. Its technological implementation has been impeded by the relatively low Curie temperature (bulk TC ∼ 42 °C) and the lack of precise domain control. Here we show that CuInP2S6 can be immune to the finite size effect and exhibits enhanced ferroelectricity, piezoelectricity, and polar alignment in the ultrathin limit when it is interfaced with ferroelectric oxide PbZr0.2Ti0.8O3 films. Piezoresponse force microscopy studies reveal that the polar domains in thin CuInP2S6 fully conform to those of the underlying PbZr0.2Ti0.8O3, where the piezoelectric coefficient changes sign and increases sharply with reducing thickness. High temperature in situ domain imaging points to a significantly enhanced TC of >200 °C for 13 nm CuInP2S6 on PbZr0.2Ti0.8O3. Density functional theory modeling and Monte Carlo simulations show that the enhanced polar alignment and TC can be attributed to interface-mediated structure distortion in CuInP2S6. Our study provides an effective material strategy to engineer the polar properties of CuInP2S6 for flexible nanoelectronic, optoelectronic, and mechanical applications.

中文翻译:

通过铁电氧化物对 CuInP2S6 中的铁电和四阱态进行界面调节

铁电范德华CuInP 2 S 6具有有趣的四阱态和负压电性。相对较低的居里温度(整体T C ∼ 42 °C)和缺乏精确的域控制阻碍了其技术实施。在这里,我们表明,当CuInP 2 S 6与铁电氧化物PbZr 0.2 Ti 0.8 O 3薄膜接触时,它可以不受有限尺寸效应的影响,并在超薄极限下表现出增强的铁电性、压电性和极性排列。压电响应力显微镜研究表明,薄CuInP 2 S 6中的极域与下面的PbZr 0.2 Ti 0.8 O 3的极域完全一致,其中压电系数改变符号并随着厚度的减小而急剧增加。高温原位域成像表明, PbZr 0.2 Ti 0.8 O 3上的 13 nm CuInP 2 S 6的T C显着增强,>200 °C 。密度泛函理论建模和蒙特卡罗模拟表明,增强的极性排列和T C可归因于CuInP 2 S 6中界面介导的结构畸变。我们的研究提供了一种有效的材料策略来设计 CuInP 2 S 6的极性特性,用于柔性纳米电子、光电和机械应用。
更新日期:2023-08-08
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