当前位置: X-MOL 学术Adv. Phys. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
A review of uranium-based thin films
Advances in Physics ( IF 35.0 ) Pub Date : 2023-07-14 , DOI: 10.1080/00018732.2023.2230292
R. Springell 1 , E. Lawrence Bright 1, 2 , D. A. Chaney 1, 2 , L. M. Harding 1 , C. Bell 1 , R. C. C. Ward 3 , G. H. Lander 1, 4
Affiliation  

Thin films based on silicon and transition-metal elements dominate the semi-conducting industry and are ubiquitous in all modern devices. Films have also been produced in the rare-earth series of e...

中文翻译:

铀基薄膜综述

基于硅和过渡金属元素的薄膜在半导体工业中占据主导地位,并且在所有现代设备中无处不在。稀土系列电影也已制作...
更新日期:2023-07-14
down
wechat
bug