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Cs3Cu2I5 Single Crystal for Efficient Direct X-Ray Detection
Advanced Optical Materials ( IF 8.0 ) Pub Date : 2023-06-28 , DOI: 10.1002/adom.202300247 Qinhua Wei 1 , Xiongsheng Fan 2, 3 , Peng Xiang 1 , Laishun Qin 1 , Wenjun Liu 2 , Tongyu Shi 2 , Hang Yin 1, 4 , Peiqing Cai 3 , Yufeng Tong 1 , Gao Tang 1 , Zugang Liu 3 , Paul K. Chu 5 , Hongsheng Shi 6 , Yanliang Liu 2 , Xue‐Feng Yu 2
Advanced Optical Materials ( IF 8.0 ) Pub Date : 2023-06-28 , DOI: 10.1002/adom.202300247 Qinhua Wei 1 , Xiongsheng Fan 2, 3 , Peng Xiang 1 , Laishun Qin 1 , Wenjun Liu 2 , Tongyu Shi 2 , Hang Yin 1, 4 , Peiqing Cai 3 , Yufeng Tong 1 , Gao Tang 1 , Zugang Liu 3 , Paul K. Chu 5 , Hongsheng Shi 6 , Yanliang Liu 2 , Xue‐Feng Yu 2
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Low-dimensional copper-based halide single crystals are considered excellent scintillators for indirect X-ray detection, but their potential in direct X-ray detection has not been investigated. Herein, high-quality pure Cs3Cu2I5 and Li-doped Cs3Cu2I5:Li single crystals are grown by the Bridgman method. The Li+ dopant enhances the photoelectric properties of the Cs3Cu2I5 single crystal by extending the carrier lifetime, improving the carrier mobility from 6.49 to 9.52 cm2 V−1 s−1, and increasing the mobility-lifetime (µτ) product from 1.4 × 10−4 to 2.9 × 10−4 cm2 V−1. The sensitive direct X-ray detector with a vertical device configuration of Au/Cs3Cu2I5:Li single crystal/PCBM/Au is fabricated and demonstrated to have a high sensitivity of 831.1 µC Gyair−1 cm−2 and low detection limit of 34.8 nGyair s−1. Furthermore, the detector shows negligible baseline current drift and excellent stability upon X-ray radiation.
中文翻译：
用于高效直接 X 射线检测的 Cs3Cu2I5 单晶
低维铜基卤化物单晶被认为是用于间接X射线检测的优异闪烁体，但其在直接X射线检测中的潜力尚未得到研究。本文中，通过布里奇曼法生长了高质量的纯Cs 3 Cu 2 I 5和Li掺杂Cs 3 Cu 2 I 5 :Li单晶。Li +掺杂剂通过延长载流子寿命来增强Cs 3 Cu 2 I 5单晶的光电性能，将载流子迁移率从6.49提高到9.52 cm 2 V -1 s -1，并将迁移率-寿命(μ τ )乘积从1.4 × 10 -4增加到2.9 × 10 -4 cm 2 V -1。制备了具有Au/Cs 3 Cu 2 I 5 :Li单晶/PCBM/Au垂直器件配置的灵敏直接X射线探测器，并证明其具有831.1 µC Gy air -1 cm -2的高灵敏度和低灵敏度。检测限为 34.8 nGy空气 s -1。此外，探测器在 X 射线辐射下表现出可忽略不计的基线电流漂移和出色的稳定性。
更新日期：2023-06-28
中文翻译：
用于高效直接 X 射线检测的 Cs3Cu2I5 单晶
低维铜基卤化物单晶被认为是用于间接X射线检测的优异闪烁体，但其在直接X射线检测中的潜力尚未得到研究。本文中，通过布里奇曼法生长了高质量的纯Cs 3 Cu 2 I 5和Li掺杂Cs 3 Cu 2 I 5 :Li单晶。Li +掺杂剂通过延长载流子寿命来增强Cs 3 Cu 2 I 5单晶的光电性能，将载流子迁移率从6.49提高到9.52 cm 2 V -1 s -1，并将迁移率-寿命(μ τ )乘积从1.4 × 10 -4增加到2.9 × 10 -4 cm 2 V -1。制备了具有Au/Cs 3 Cu 2 I 5 :Li单晶/PCBM/Au垂直器件配置的灵敏直接X射线探测器，并证明其具有831.1 µC Gy air -1 cm -2的高灵敏度和低灵敏度。检测限为 34.8 nGy空气 s -1。此外，探测器在 X 射线辐射下表现出可忽略不计的基线电流漂移和出色的稳定性。
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