基于 DC-DC eGaN-FET 的 PoL 转换器工作台研究中对降额敏感的钽聚合物电容器的故障率。,Micromachines

当前位置： X-MOL 学术 › Micromachines › 论文详情

Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)

基于 DC-DC eGaN-FET 的 PoL 转换器工作台研究中对降额敏感的钽聚合物电容器的故障率。
Micromachines ( IF 3.0 ) Pub Date : 2023-01-15 , DOI: 10.3390/mi14010221
Dan Butnicu ₁

Affiliation

最近的许多研究表明，从可靠性的角度来看，PoL（负载点）转换器的输出电容器是最重要的组件。为了在许多应用中获得最大程度的可靠性，通常建议设计人员降低此电容器的额定值——因此，需要仔细了解它以确定转换器的总体参数。PoL 转换器常见于许多电子系统中。它们最重要的要求是随负载电流变化的稳定输出电压、良好的温度稳定性、低输出纹波电压以及高效率和可靠性。如果所讨论的电子系统必须是便携式的，那么占地面积小和体积小也是重要的考虑因素——这两者最近都在 eGaN 晶体管技术中得到了很好的实现。本文详细介绍了如何降低输出电容器的额定值，特别是导电钽聚合物表面贴装芯片，因为这种类型的电容器代表了在小型化和可靠性方面向前迈出的一步，超过了分立式 eGaN-FET 中使用的先前存在的湿式电解电容器。基于 PoL 的降压转换器决定了最佳性能和最高 MTBF。为了达到研究的主要范围，测试了基于封装在具有 12 V 输入电压/1.2 V 输出电压的 9059/30 V 评估板中的 EPC eGaN FET 晶体管的设置。典型的电气性能和可靠性数据通常由制造商通过技术论文为客户提供；这种公共数据通常被选择来以有利的方式显示电容器，它们提供了很多有用的信息。在本文中，介绍了电容器降额过程，以基本概述钽聚合物电容器在 DC-DC 降压转换器的输出滤波器中使用时的可靠性性能特征。基于对电容器的胶囊表面温度进行热扫描来计算电容器的故障率，并评估了 PoL 转换器的行为。

"点击查看英文标题和摘要"

A Derating-Sensitive Tantalum Polymer Capacitor's Failure Rate within a DC-DC eGaN-FET-Based PoL Converter Workbench Study.

Many recent studies have revealed that PoL (Point of Load) converters' output capacitors are a paramount component from a reliability point of view. To receive the maximum degree of reliability in many applications, designers are often advised to derate this capacitor-as such, a careful comprehending of it is required to determine the converter's overall parameters. PoL converters are commonly found in many electronic systems. Their most important requirements are a stable output voltage with load current variation, good temperature stability, low output ripple voltage, and high efficiency and reliability. If the electronic system in question must be portable, a small footprint and volume are also important considerations-both of which have recently been well accomplished in eGaN transistor technologies. This paper provides details on how derating an output capacitor-specifically, a conductive tantalum polymer surface-mount chip, as this type of capacitor represented a step forward in miniaturization and reliability over previously existing wet electrolytic capacitors-used within a discrete eGaN-FET-based PoL buck converter determines the best performance and the highest MTBF. A setup based on an EPC eGaN FET transistor enclosed in a 9059/30 V evaluation board with a 12 V input voltage/1.2 V output voltage was tested in order to achieve the study's main scope. Typical electrical performance and reliability data are often provided for customers by manufacturers through technical papers; this kind of public data is often selected to show the capacitors in a favorable light-still, they provide much useful information. In this paper, the capacitor derating process was presented to give a basic overview of the reliability performance characteristics of tantalum polymer capacitor when used within a DC-DC buck converter's output filter. Performing calculations of the capacitor's failure rate based on taking a thermal scan of the capacitor's capsule surface temperature, the behavior of the PoL converter was evaluated.

更新日期：2023-01-15

点击分享查看原文

点击收藏

公开下载

阅读更多本刊新发论文本刊介绍/投稿指南