Wavefront Microscopy Using Quadriwave Lateral Shearing Interferometry: From Bioimaging to Nanophotonics,ACS Photonics

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Wavefront Microscopy Using Quadriwave Lateral Shearing Interferometry: From Bioimaging to Nanophotonics
ACS Photonics ( IF 6.5 ) Pub Date : 2023-01-17 , DOI: 10.1021/acsphotonics.2c01238
Guillaume Baffou ₁

Affiliation

Common cameras are only sensitive to the intensity of light, discarding an essential feature of a light wave: its phase profile or, equivalently, its wavefront profile. This Review focuses on a rising wavefront imaging technique called quadriwave lateral shearing interferometry (QLSI), based on the simple use of a 2-dimensional diffraction grating, aka a cross-grating, in front of a regular camera. We detail the working principle of QLSI and its implementation on an optical microscope. We highlight its microscopy applications in bioimaging and nanophotonics, in particular for the characterization of living cells, nanoparticles, 2D materials, metasurfaces, microscale temperature gradients, and surface topography. Finally, we draw a critical comparison of QLSI with current quantitative phase microscopy techniques, namely, digital holography microscopy (DHM), spatial light interference microscopy (SLIM), and diffraction phase microscopy (DPM).

中文翻译：

使用四波横向剪切干涉测量法的波前显微镜：从生物成像到纳米光子学

普通相机只对光的强度敏感，而忽略了光波的一个基本特征：它的相位轮廓或等效的波前轮廓。本综述重点介绍了一种称为四波横向剪切干涉测量法 (QLSI) 的上升波前成像技术，该技术基于在普通相机前简单使用二维衍射光栅（也称为交叉光栅）。我们详细介绍了 QLSI 的工作原理及其在光学显微镜上的实现。我们重点介绍了它在生物成像和纳米光子学中的显微应用，特别是活细胞、纳米粒子、二维材料、超表面、微尺度温度梯度和表面形貌的表征。最后，我们对 QLSI 与当前的定量相位显微技术进行了重要比较，即

更新日期：2023-01-17

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