Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy,Microscopy Research and Technique

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Toward a better modulus at shallow indentations—Enhanced tip and sample characterization for quantitative atomic force microscopy
Microscopy Research and Technique ( IF 2.0 ) Pub Date : 2022-11-18 , DOI: 10.1002/jemt.24261
David S Owen ₁

Affiliation

Approximations of the geometry of indenting probes, particularly when using shallow indentations on soft materials, can lead to the erroneous reporting of mechanical data in atomic force microscopy (AFM). Scanning electron microscopy (SEM) identified a marked change in geometry toward the tip apex where the conical probe assumes a near linear flat-punch geometry. Polydimethylsiloxane (PDMS) is a ubiquitous elastomer within the materials and biological sciences. Its elastic modulus is widely characterized but the data are dispersed and can display orders of magnitude disparity. Herein, we compare the moduli gathered from a range of analytical techniques and relate these to the molecular architecture identified with AFM. We present a simple method that considers sub-100 nm indentations of PDMS using the Hertz and Sneddon contact mechanics models, and how this could be used to improve the output of shallow indentations on similarly soft materials, such as polymers or cells.

中文翻译：

在浅压痕处获得更好的模量 - 用于定量原子力显微镜的增强尖端和样品表征

压痕探针几何形状的近似值，特别是在软材料上使用浅压痕时，可能会导致原子力显微镜 (AFM) 中机械数据的错误报告。扫描电子显微镜 (SEM) 确定了朝向尖端顶点的几何形状的显着变化，其中锥形探针呈现出接近线性的平冲几何形状。聚二甲基硅氧烷 (PDMS) 是材料和生物科学中普遍存在的弹性体。其弹性模量被广泛表征，但数据分散，可以显示数量级的差异。在此，我们比较了从一系列分析技术中收集的模量，并将这些与 AFM 识别的分子结构相关联。我们提出了一种使用 Hertz 和 Sneddon 接触力学模型考虑 PDMS 亚 100 nm 压痕的简单方法，

更新日期：2022-11-18

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