Short-Pulse Photothermal Modulation of Silicon Optical Cavities Measured by a Continuous Mid-IR Probe,The Journal of Physical Chemistry C

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Short-Pulse Photothermal Modulation of Silicon Optical Cavities Measured by a Continuous Mid-IR Probe
The Journal of Physical Chemistry C ( IF 3.3 ) Pub Date : 2022-03-02 , DOI: 10.1021/acs.jpcc.1c09792
Anuj K. Pennathur ₁ , Cindy Tseng ₁ , Jahan M. Dawlaty ₁

Affiliation

Photothermal effects, or changes in physical properties of materials in response to heat delivered by light, have a number of applications including the recent success in subdiffraction IR microscopy. Optical cavities, which are at the core of numerous technologies, are also sensitive to thermal effects. Here we bring these ideas together by demonstrating and modeling short-pulse photothermal modulation of a Fabry–Perot cavity formed between the two polished faces of a single silicon wafer. We used near-IR ultrafast pump pulses to transiently heat a silicon cavity while monitoring its transmission with a continuous-wave mid-IR probe. The temperature change induced by the pump pulse changes the refractive index of silicon, which in turn shifts the cavity resonances and the transmission spectrum. We model both the magnitude and the temporal behavior of the photothermal response of the cavity. We envisage applications of photothermal modulation of cavities in the area of optical switches and in photothermal microscopy of thin films.

中文翻译：

用连续中红外探头测量的硅光腔的短脉冲光热调制

光热效应或材料的物理特性响应光传递的热量而发生的变化具有许多应用，包括最近在亚衍射红外显微镜中的成功。作为众多技术核心的光腔对热效应也很敏感。在这里，我们通过演示和模拟在单个硅晶片的两个抛光面之间形成的法布里-珀罗腔的短脉冲光热调制，将这些想法结合在一起。我们使用近红外超快泵浦脉冲瞬时加热硅腔，同时用连续波中红外探头监测其传输。泵浦脉冲引起的温度变化会改变硅的折射率，进而改变腔谐振和透射光谱。我们模拟了腔的光热响应的幅度和时间行为。我们设想在光开关领域和薄膜的光热显微镜中应用腔的光热调制。

更新日期：2022-03-02

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