金属 Pd、Ag 和 Sn 的俄歇光电子符合光谱 (APECS) 光谱分析,Journal of Electron Spectroscopy and Related Phenomena

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金属 Pd、Ag 和 Sn 的俄歇光电子符合光谱 (APECS) 光谱分析
Journal of Electron Spectroscopy and Related Phenomena ( IF 1.8 ) Pub Date : 2005-07-01 , DOI: 10.1016/j.elspec.2005.01.035
Masahide Ohno

摘要考虑到 M4–M5–VV Coster–Kronig (CK) 跃迁之前发生的可能性，分析了与 M45–VV( 1 G) 俄歇电子线重合测量的 Ag 金属的 M45 级光电子谱。俄歇过渡。我们分别用 MX(MXY) 和 V 表示原子壳 M x (M xy ) 和 N xy ( x , y = 4,5) 。M4-M5 CK 转换率非常小。分析了与 M4（或 M5）级光电子线同时测量的金属 Pd 和 Sn 的 M45-VV 俄歇电子光谱。M4-M5 CK 转变率在金属 Pd 和 Sn 中也非常小。先前被解释为 M4-M5-VV（或 M4-M5V-VVV）俄歇电子线的重合俄歇电子线主要是由于 M4 级光电子线下方的非弹性散射 M5 级光电子背景。Pd 金属的 APECS 光谱显示了局部 M5V 振动两孔态的 M5V-VVV 跃迁的第一个证据。与测量的结果相比，与 M4 级光电发射线下方的非弹性散射 M5 级光电子背景同时测量的非弹性散射俄歇电子背景与 Ag 金属的 M5-VV 俄歇电子主线的强度比增加与 M5 级光电子主线重合。这是因为当光电子非弹性散射的概率增加时，同一电离原子发射的俄歇电子非弹性散射的概率增加。换句话说，光电子和俄歇电子来自更深的原子位点（更长的路径长度）。

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Analysis of the Auger-photoelectron coincidence spectroscopy (APECS) spectra of metallic Pd, Ag, and Sn

Abstract The M45-level photoelectron spectrum of Ag metal measured in coincidence with the M45–VV( 1 G) Auger-electron line is analyzed by taking into account the possibility of the M4–M5–VV Coster–Kronig (CK)-transition preceded Auger transition. We denote the atomic shells M x (M xy ) and N xy ( x , y = 4,5) by MX(MXY) and V, respectively. The M4–M5 CK-transition rate is very small. The M45–VV Auger-electron spectra of metallic Pd and Sn measured in coincidence with the M4 (or M5)-level photoelectron line are analyzed. The M4–M5 CK-transition rates are also very small in metallic Pd and Sn. The coincidence Auger-electron line previously interpreted as the M4–M5–VV (or M4–M5V–VVV) Auger-electron line is largely due to the inelastically scattered M5-level photoelectron background beneath the M4-level photoelectron line. The APECS spectrum of Pd metal shows the first evidence of the M5V–VVV transition of the localized M5V shakeup two-hole state. The intensity ratio of the inelastically scattered Auger-electron background to the M5–VV Auger-electron main line of Ag metal measured in coincidence with the inelastically scattered M5-level photoelectron background beneath the M4-level photoemission line increases, as compared to that measured in coincidence with the M5-level photoelectron main line. This is because when the probability of the photoelectron being inelastically scattered increases, that of the Auger electron emitted by the same ionized atom, being inelastically scattered increases. In other words the photoelectrons and the Auger electrons are originated from the deeper atomic sites (longer pathlength).

更新日期：2005-07-01

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