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Synthesis of High-Performance Monolayer Molybdenum Disulfide at Low Temperature
Small Methods ( IF 10.7 ) Pub Date : 2021-04-19 , DOI: 10.1002/smtd.202000720
Ji-Hoon Park 1, 2 , Ang-Yu Lu 1 , Pin-Chun Shen 1 , Bong Gyu Shin 3 , Haozhe Wang 1 , Nannan Mao 1 , Renjing Xu 4 , Soon Jung Jung 3 , Donhee Ham 4 , Klaus Kern 3, 5 , Yimo Han 6 , Jing Kong 1, 2
Affiliation  

The large-area synthesis of high-quality MoS2 plays an important role in realizing industrial applications of optoelectronics, nanoelectronics, and flexible devices. However, current techniques for chemical vapor deposition (CVD)-grown MoS2 require a high synthetic temperature and a transfer process, which limits its utilization in device fabrications. Here, the direct synthesis of high-quality monolayer MoS2 with the domain size up to 120 µm by metal-organic CVD (MOCVD) at a temperature of 320 °C is reported. Owing to the low-substrate temperature, the MOCVD-grown MoS2 exhibits low impurity doping and nearly unstrained properties on the growth substrate, demonstrating enhanced electronic performance with high electron mobility of 68.3 cm2 V−1 s−1 at room temperature. In addition, by tuning the precursor ratio, a better understanding of the MoS2 growth process via a geometric model of the MoS2 flake shape, is developed, which can provide further guidance for the synthesis of 2D materials.

中文翻译:

高性能单层二硫化钼的低温合成

高质量MoS 2的大面积合成对于实现光电子学、纳米电子学和柔性器件的工业应用具有重要作用。然而,目前用于化学气相沉积 (CVD) 生长的 MoS 2 的技术需要高合成温度和转移过程,这限制了其在器件制造中的应用。在这里,报道了通过金属有机 CVD (MOCVD) 在 320 °C 的温度下直接合成域尺寸高达 120 µm的高质量单层 MoS 2。由于衬底温度低,MOCVD 生长的 MoS 2在生长衬底上表现出低杂质掺杂和几乎无应变的特性,显示出增强的电子性能,在室温下具有 68.3 cm 2 V -1 s -1 的高电子迁移率。此外,通过调整前驱体比例,可以通过 MoS 2薄片形状的几何模型更好地理解 MoS 2生长过程,这可以为二维材料的合成提供进一步的指导。
更新日期:2021-06-10
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