用于片上 ADC 测试的一位 ΣΔ 编码激励生成,Journal of Circuits, Systems and Computers

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用于片上 ADC 测试的一位 ΣΔ 编码激励生成
Journal of Circuits, Systems and Computers ( IF 0.9 ) Pub Date : 2020-03-24 , DOI: 10.1142/s021812662050245x
Shakeel Ahmad _{1,

2} , Jerzy Dąbrowski ₁

Affiliation

本文介绍了 [公式：见正文] 调制技术在模数转换器 (ADC) 片上动态测试中的应用。所需的刺激（例如单音或双音信号）被编码为一位 [公式：见正文] 序列，通过驱动缓冲器和简单的低通重建滤波器应用于被测 ADC。通过系统的方法，我们选择 [公式：见文本] 调制器的阶数和类型，并制定适合频谱测量的频率计划。通过这种方式，我们实现了适用于 ADC 的频谱谐波和互调失真测试的高动态范围。对于高频测量（高达奈奎斯特频率），我们提出了一种新颖的低通/带通调制方案，可以避免低频量化噪声的有害影响。此外，我们还解决了由代表编码刺激的不归零波形的缓冲区缺陷引起的失真分量。我们展示了低频失真分量可以通过使用简单的迭代预失真技术来消除，该技术由直流校准 ADC 的测量支持。通过低频和高频分量之间的相关性，高频失真也可以大大减少。所提出的技术通过被测 ADC 的仿真结果来说明。通过低频和高频分量之间的相关性，高频失真也可以大大减少。所提出的技术通过被测 ADC 的仿真结果来说明。通过低频和高频分量之间的相关性，高频失真也可以大大减少。所提出的技术通过被测 ADC 的仿真结果来说明。

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One-Bit ΣΔ-Encoded Stimulus Generation for On-Chip ADC Test

This paper presents an application of the [Formula: see text] modulation technique to the on-chip dynamic test for analog-to-digital converters (ADCs). The required stimulus such as a single- or two-tone signal is encoded into one-bit [Formula: see text] sequence, which is applied to an ADC under test through a driving buffer and a simple low-pass reconstruction filter. By a systematic approach, we select the order and type of a [Formula: see text] modulator and develop a frequency plan suitable for the spectral measurement. In this way, we achieve a high dynamic range suitable for spectral harmonic and intermodulation distortion tests for ADCs. For high frequency measurements (up to the Nyquist frequency), we propose a novel low-pass/band-pass modulation scheme that allows to avoid harmful effects of the low-frequency quantization noise. Also we address the distortion components which originate from the buffer imperfections for a nonreturn-to-zero waveform representing the encoded stimulus. We show that the low-frequency distortion components can be cancelled by using a simple iterative predistortion technique supported by measurements with a DC-calibrated ADC. By correlation between low- and high-frequency components also the high frequency distortions can be largely reduced. The presented techniques are illustrated by simulation results of an ADC under test.

更新日期：2020-03-24

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