Single-atom electron microscopy for energy-related nanomaterials,Journal of Materials Chemistry A

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Single-atom electron microscopy for energy-related nanomaterials
Journal of Materials Chemistry A ( IF 10.7 ) Pub Date : 2020-07-22 , DOI: 10.1039/d0ta04918b
Mingquan Xu _{1,

2,

3,

4,

5} , Aowen Li _{1,

2,

3,

4,

5} , Meng Gao _{1,

2,

3,

4,

5} , Wu Zhou _{1,

2,

3,

4,

5}

Affiliation

The development of the aberration correction technique has enabled atomic resolution imaging in scanning transmission electron microscopy (STEM) under low accelerating voltages and pushed the detection limit of STEM-based imaging and spectroscopy analysis down to the single-atom level. The so-called “single-atom electron microscopy” brings new opportunities to study the structure–property relationship in energy-related nanomaterials at the atomic scale. In this review, we will firstly summarize some recent advances in low-voltage STEM imaging and spectroscopy with single-atom sensitivity, including emerging techniques such as STEM-DPC imaging and in situ STEM, by using two-dimensional (2D) materials as model systems. We will then discuss the application of these single-atom electron microscopy techniques to more complex energy materials via specific examples. These powerful and comprehensive capabilities of aberration-corrected STEM with single-atom sensitivity have proven to be invaluable for unveiling the origins of functionalities of energy-related nanomaterials and guiding the design of novel materials with desired performance.

中文翻译：

与能量有关的纳米材料的单原子电子显微镜

像差校正技术的发展使得能够在低加速电压下在扫描透射电子显微镜（STEM）中进行原子分辨率成像，并将基于STEM的成像和光谱分析的检测极限降低到单原子水平。所谓的“单原子电子显微镜”为研究与能量有关的纳米材料在原子尺度上的结构-性质关系提供了新的机会。在这篇综述中，我们将首先总结一下具有单原子敏感性的低压STEM成像和光谱学的一些最新进展，包括新兴技术，例如STEM-DPC成像和原位成像STEM，通过使用二维（2D）材料作为模型系统。然后，我们将通过具体示例讨论这些单原子电子显微镜技术在更复杂的能量材料中的应用。这些具有单原子灵敏度的像差校正STEM的强大而全面的功能，对于揭示与能源相关的纳米材料的功能起源以及指导具有所需性能的新型材料的设计具有无价的价值。

更新日期：2020-08-18

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