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Large Lead‐Free Perovskite Single Crystal for High‐Performance Coplanar X‐Ray Imaging Applications
Advanced Optical Materials ( IF 8.0 ) Pub Date : 2020-07-12 , DOI: 10.1002/adom.202000814
Yucheng Liu 1 , Yunxia Zhang 1 , Zhou Yang 1 , Jian Cui 1 , Haodi Wu 2 , Xiaodong Ren 1 , Kui Zhao 1 , Jiangshan Feng 1 , Jiang Tang 2 , Zhuo Xu 1 , Shengzhong (Frank) Liu 1, 3, 4
Affiliation  

Lead‐based (Pb) perovskite recently emerged as a promising photoelectric material for direct ionization radiation detection with outstanding performance. Unfortunately, its application is limited due to its toxicity caused by high Pb content, serious ion migration, poor crystallite quality, unsatisfactory reproducibility, high resistivity, and large fluctuation of electronic properties. Herein, a better substitute of lead‐free inch‐sized (34.3 mm × 34.3 mm × 13.1 mm) high‐quality halide (CH3NH3)3Bi2I9 single crystal (MA3Bi2I9 SC) is presented with higher resistivity, lower ion migration, and better stability. The coplanar detector fabricated using the MA3Bi2I9 SC shows low dark noise current and outstanding X‐ray response including a high sensitivity of 872 μC Gy−1 cm−2, short response time of 266 μs, low detection limit of 31 nGy s−1, good spatial resolution of 4.22 lp mm−1, long‐term working stability, and excellent uniformity. Thanks to these excellent properties, the coplanar MA3Bi2I9 SC X‐ray detector array shows high‐resolution X‐ray imaging. The present report may inspire development of next‐generation high‐energy radiation detection and imaging using lead‐free perovskite single crystals.

中文翻译:

适用于高性能共面X射线成像应用的大型无铅钙钛矿单晶

铅基钙钛矿最近以其出色的性能成为一种有前途的光电材料,可用于直接电离辐射检测。不幸的是,由于高Pb含量,严重的离子迁移,不良的微晶质量,不令人满意的重现性,高电阻率和大的电子性能波动引起的毒性,其应用受到了限制。在此,更好地替代了无铅英寸尺寸(34.3 mm×34.3 mm×13.1 mm)高质量卤化物(CH 3 NH 33 Bi 2 I 9单晶(MA 3 Bi 2 I 9SC)具有更高的电阻率,更低的离子迁移率和更好的稳定性。使用MA共面检测器制造3的Bi 2个9 SC节目低的暗电流噪声和包括872高灵敏度出色透视响应μ Ç戈瑞-1厘米-2,266微秒短的响应时间,低检测限31 NGY小号-1,4.22 LP毫米的空间分辨率良好-1,长期工作稳定性,和优异的均匀性。由于这些优异的性能,共面MA 3 Bi 2 I 9SC X射线探测器阵列可显示高分辨率的X射线成像。本报告可能会启发使用无铅钙钛矿单晶开发下一代高能辐射检测和成像技术。
更新日期:2020-07-12
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